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Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs.
Ninoslav Stojadinovic
Ivica Manic
Snezana Djoric-Veljkovic
Vojkan Davidovic
Snezana Golubovic
Sima Dimitrijev
Published in:
Microelectron. Reliab. (2001)
Keyphrases
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positive and negative
power consumption
building blocks
boundary conditions
neural network
artificial neural networks
mechanism design
mechanisms underlying
databases
real world
database systems
image sequences
positive feedback
multiple input
nano scale