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Modelling and experimental verification of the impact of negative bias temperature instability on CMOS inverter.
N. Berbel
Raúl Fernández-García
Ignacio Gil
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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experimental verification
positive and negative
low cost
power consumption
neural network
high speed
digital camera
low power
image sensor
circuit design