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Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection.
Raymond K. K. Yip
Peter Kwong-Shun Tam
Dennis N. K. Leung
Published in:
IEEE Trans. Pattern Anal. Mach. Intell. (1994)
Keyphrases
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fourier descriptors
symmetry detection
rotational symmetry
affine transformation
affine invariant
shape analysis
shape representation
feature vectors
shape features
machine learning
shape descriptors
three dimensional
viewpoint
fourier transform
zernike moments