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Test set enhancement for quality transition faults using function-based methods.

Stelios NeophytouMaria K. MichaelSpyros Tragoudas
Published in: ACM Great Lakes Symposium on VLSI (2005)
Keyphrases
  • test set
  • training set
  • error rate
  • evaluation methodology
  • training data
  • object recognition
  • cross validation
  • cost sensitive