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Vertically Stacked CMOS-Compatible Photodiodes for Scanning Electron Microscopy.
Lionel C. Gontard
Juan A. Leñero-Bardallo
Francisco M. Varela-Feria
Ricardo Carmona-Galán
Published in:
ISCAS (2020)
Keyphrases
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electron microscopy
x ray
low energy
image stacks
high speed
analog vlsi
power consumption
scan data
thin film
low cost
circuit design
power supply
image processing
microscopy images
structured light
low power
image segmentation
single chip
image sensor
focal plane
three dimensional
neural network