Method and application of data defect analysis based on linear discriminant regression of far subspace.
Wendai LvPublished in: Clust. Comput. (2019)
Keyphrases
- input data
- linear discriminant
- data analysis
- data sets
- test data
- data points
- model selection
- principal components
- prior knowledge
- data distribution
- principal component analysis
- pairwise
- high dimensional
- fisher criterion
- error rate
- feature set
- dimensionality reduction
- support vector machine
- classification accuracy
- feature extraction
- decision trees
- image processing