Generalization Across Experimental Parameters in Machine Learning Analysis of High Resolution Transmission Electron Microscopy Datasets.
Katherine SytwuLuis Rangel DaCostaMary C. ScottPublished in: CoRR (2023)
Keyphrases
- machine learning
- high resolution
- transmission electron microscopy
- low resolution
- real world
- data sets
- high quality
- parameter values
- statistical analysis
- x ray
- feature selection
- data analysis
- image processing
- support vector machine
- active learning
- artificial intelligence
- parameter estimation
- remote sensing
- statistical methods
- learning tasks
- parameter space
- field of view