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A Single-Loop Approach for Time-Variant Reliability-Based Design Optimization.
Zhi Liang Huang
Chao Jiang
Xiao Ming Li
Xinpeng Wei
Teng Fang
Xu Han
Published in:
IEEE Trans. Reliab. (2017)
Keyphrases
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data sets
neural network
bayesian networks
special case
highly reliable
learning algorithm
information systems
information technology
failure rate