A method for generating structurally aligned grids for semiconductor device simulation.
Clemens HeitzingerAlireza SheikholeslamiJong Mun ParkSiegfried SelberherrPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2005)
Keyphrases
- synthetic data
- high precision
- fully automatic
- significant improvement
- detection method
- generation method
- experimental evaluation
- classification accuracy
- high accuracy
- monte carlo simulation
- theoretical analysis
- dynamic programming
- image processing
- support vector machine svm
- detection algorithm
- support vector machine
- cost function
- prior knowledge
- simulation model
- preprocessing
- similarity measure