Fatigue and thermal fatigue damage analysis of thin metal films.

Guangping Zhang C. A. Volkert Ruth Schwaiger R. Mönig O. Kraft

Published in: Microelectron. Reliab. (2007)

Keyphrases

statistical analysis
database
data sets
real world
data mining
real time
databases
bayesian networks
search algorithm
data analysis
infrared
finite element analysis
electrical properties