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Long-term reliability of Ti-Pt-Au metallization system for Schottky contact and first-level metallization on SiC MESFET.
A. Sozza
Christian Dua
A. Kerlain
C. Brylinski
Enrico Zanoni
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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long term
short term
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medium term