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RF performance reliability of power N-LDMOS under pulsed-RF aging life test in radar application S-band.

Mohamed Ali BelaïdAhmed AlmusallamMohamed Masmoudi
Published in: IET Circuits Devices Syst. (2020)
Keyphrases
  • relevance feedback
  • radio frequency
  • power consumption
  • conducted an empirical study
  • data sets
  • information retrieval
  • active learning
  • application specific