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Photodiode sensitivity measurement methodology using low light intensity for optically reconfigurable gate arrays.

Bharat RamanathanMinoru Watanabe
Published in: ICCSE (2016)
Keyphrases
  • low light
  • wide band
  • low light conditions
  • noise level
  • motion blur
  • low cost
  • visible spectrum
  • multiscale
  • image analysis
  • high resolution
  • high speed
  • error rate
  • motion deblurring