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A multi level testability assistant for VLSI design.

Massimo BombanaGiacomo BuonannoPatrizia CavalloroDonatella SciutoGiuseppe Zaza
Published in: EURO-DAC (1992)
Keyphrases
  • vlsi design
  • test bed
  • design methodology
  • test data generation
  • intelligent assistant
  • database
  • databases
  • decision making
  • neural network
  • data analysis