Login / Signup

Approaches to On-chip Testing of Mixed Signal Macros in ASICs.

R. A. Cobley
Published in: ED&TC (1996)
Keyphrases
  • mixed signal
  • low power
  • high speed
  • physical design
  • low cost
  • vlsi circuits
  • hidden markov models
  • image restoration
  • test cases
  • power consumption