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Interface delamination analysis of TQFP package during solder reflow.

Hu GuojunRoberto RossiJing-en LuanXavier Baraton
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • statistical analysis
  • quantitative analysis
  • database
  • user interface
  • automatic analysis
  • real time
  • computer vision
  • optimal solution
  • information technology
  • multiresolution
  • user friendly
  • finite element