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Quality versus cost analysis for 3D Stacked ICs.

Mottaqiallah TaouilSaid HamdiouiErik Jan Marinissen
Published in: VTS (2014)
Keyphrases
  • data analysis
  • image analysis
  • multiscale
  • multi class
  • cost sensitive
  • high quality
  • search algorithm
  • relational databases
  • mobile robot
  • quantitative analysis
  • quality assessment
  • higher quality