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Conductive particle detection via deep learning for ACF bonding in TFT-LCD manufacturing.

Eryun LiuKangping ChenZhiyu XiangJun Zhang
Published in: J. Intell. Manuf. (2020)
Keyphrases
  • deep learning
  • tft lcd
  • unsupervised learning
  • unsupervised feature learning
  • machine learning
  • mental models
  • object detection
  • manufacturing systems
  • information extraction
  • supply chain
  • weakly supervised