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Numerical Analysis of the Effect of Thin-Film Thickness and Material in Field Mapping of Eddy-Current Probes Using Photoinductive Technique.

Yen-Lin PanCheng-Chi TaiDong-Shong Liang
Published in: IEICE Trans. Electron. (2012)
Keyphrases
  • numerical analysis
  • eddy current
  • image enhancement
  • magnetic field
  • finite difference
  • three dimensional
  • constraint satisfaction
  • thin film
  • film thickness