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Sequential circuit testability enhancement using a nonscan approach.
Elizabeth M. Rudnick
Vivek Chickermane
Prithviraj Banerjee
Janak H. Patel
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (1995)
Keyphrases
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feature selection
high speed
electronic circuits
circuit design
neural network
sequential search
analog circuits
image enhancement
case study
sequential data
image processing
information systems
databases
multiresolution
evolutionary algorithm
power consumption
web services