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Inverse-Designed Dual Layer c-Si/SiN Vertical Grating Couplers Tested on 300mm Wafers.

Sean HootenMudit JainThomas Van VaerenberghPeng SunQuentin WilmartM. Ashkan SeyediZhihong HuangMarco FiorentinoRaymond G. Beausoleil
Published in: OECC/PSC (2022)
Keyphrases
  • computer vision
  • neural network
  • real world
  • three dimensional
  • rms error
  • real time
  • data sets
  • e learning
  • metadata
  • case study
  • multi layer
  • average error
  • long period