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Data-Driven Batch-End Quality Modeling and Monitoring Based on Optimized Sparse Partial Least Squares.
Qingchao Jiang
Xuefeng Yan
Hui Yi
Furong Gao
Published in:
IEEE Trans. Ind. Electron. (2020)
Keyphrases
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partial least squares
data driven
canonical correlation analysis
discriminant analysis
dimension reduction
neural network
ls svm
pattern recognition
high dimensional
feature vectors
principal component analysis