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Data-Driven Batch-End Quality Modeling and Monitoring Based on Optimized Sparse Partial Least Squares.

Qingchao JiangXuefeng YanHui YiFurong Gao
Published in: IEEE Trans. Ind. Electron. (2020)
Keyphrases
  • partial least squares
  • data driven
  • canonical correlation analysis
  • discriminant analysis
  • dimension reduction
  • neural network
  • ls svm
  • pattern recognition
  • high dimensional
  • feature vectors
  • principal component analysis