Using Node Diagnosability to Determine t-Diagnosability under the Comparison Diagnosis Model.
Chieh-Feng ChiangJimmy J. M. TanPublished in: IEEE Trans. Computers (2009)
Keyphrases
- discrete event
- fault diagnosis
- formal model
- high level
- dynamic systems
- probabilistic model
- model based diagnosis
- statistical model
- mathematical model
- discrete event systems
- database
- global consistency
- process model
- fuzzy logic
- cost function
- image segmentation
- artificial intelligence
- machine learning
- neural network
- data sets