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A Novel Statistical Timing and Leakage Power Characterization of Partially Depleted Silicon-on-Insulator Gates.
Kyung Ki Kim
Yong-Bin Kim
Fabrizio Lombardi
Published in:
IEEE Trans. Instrum. Meas. (2009)
Keyphrases
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silicon on insulator
ibm power processor
power consumption
computational complexity
wavelet transform
cmos technology