Login / Signup

Test circuits for fast and reliable assessment of CDM robustness of I/O stages.

Wolfgang StadlerKai EsmarkK. ReyndersM. ZubeidatMichael GrafWolfgang WilkeningJ. WillemenNing QuS. MettlerM. Etherton
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • input output
  • databases
  • high speed
  • file system
  • real time
  • cost effective
  • high level synthesis
  • information systems
  • test data
  • high robustness
  • delay insensitive