A common image representation and a patch-based search for correlative light-electron-microscopy (CLEM) registration.
Bertha Mayela Toledo AcostaPatrick BouthemyCharles KervrannPublished in: ISBI (2016)
Keyphrases
- image representation
- electron microscopy
- image classification
- multiscale
- image content
- x ray
- object recognition
- low energy
- bag of words
- quadtree
- sparse representation
- image features
- image stacks
- image retrieval
- sparse coding
- visual words
- representation scheme
- scene recognition
- image database
- image registration
- bag of features
- scene classification
- neural network
- bag of visual words
- three dimensional