Automatic recognition of epileptic EEG patterns via Extreme Learning Machine and multiresolution feature extraction.
Yuedong SongJiaxiang ZhangPublished in: Expert Syst. Appl. (2013)
Keyphrases
- automatic recognition
- multiresolution
- extreme learning machine
- feature extraction
- eeg signals
- wavelet transform
- feed forward neural networks
- feedforward neural networks
- brain activity
- pattern classification
- support vector regression
- eeg data
- hidden nodes
- single layer
- face recognition
- neural network
- feature selection
- brain computer interface
- gaussian processes
- extracted features
- support vector machine svm
- feature vectors
- pattern recognition
- image processing
- multi layer
- feature space