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A Charge Domain SRAM Compute-in-Memory Macro With C-2C Ladder-Based 8-Bit MAC Unit in 22-nm FinFET Process for Edge Inference.

Hechen WangRenzhi LiuRichard DorranceDeepak DasalukunteDan LakeBrent R. Carlton
Published in: IEEE J. Solid State Circuits (2023)
Keyphrases
  • domain specific
  • random access memory
  • process model
  • edge detection
  • image processing
  • image segmentation
  • bayesian networks
  • domain knowledge
  • x ray
  • domain independent
  • inference process