A Multiplexor Based Test Method for Self-Timed Circuits.
Frank te BeestAd M. G. PeetersPublished in: ASYNC (2005)
Keyphrases
- high accuracy
- computational cost
- detection method
- high precision
- cost function
- significant improvement
- preprocessing
- fully automatic
- dynamic programming
- computational complexity
- image processing
- feature set
- test data
- synthetic data
- main contribution
- neural network
- segmentation method
- error rate
- evaluation method
- optimization algorithm
- computationally efficient
- model selection
- image quality
- support vector machine
- prior knowledge
- objective function