Sign in
Investigating the impact of the defect dynamic characteristics on the PBTI in the high-κ gate device.
Xianqiang Liu
Xiaodi Xu
Chenjie Gu
Renyuan Gu
Weiwei Wang
Wenjun Liu
Tianli Duan
Published in:
Microelectron. Reliab. (2018)
Keyphrases
</>
dynamic characteristics
high impact
neural network model
wide range
expert systems
high precision
data acquisition
decision making
image processing
information technology
computational intelligence
transmission line