Image-based magnification calibration for electron microscope.

Koichi Ito Ayako Suzuki Takafumi Aoki Ruriko Tsuneta

Published in: Mach. Vis. Appl. (2014)

Keyphrases

electron microscope
three dimensional
x ray
noise level
camera calibration
spatial resolution
low resolution
super resolution
computer vision
focal length
image processing
high resolution
error rate
x ray images
low dose