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A prognostic method for the embedded failure monitoring of solder interconnections with 1149.4 test bus architecture.
Juha-Veikko Voutilainen
Jussi Putaala
Markku Moilanen
Heli Jantunen
Published in:
Microelectron. J. (2009)
Keyphrases
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significant improvement
real time
similarity measure
cost function
experimental evaluation
segmentation algorithm
high precision
test data
neural network
decision trees
dynamic programming
management system
detection algorithm
clustering method
detection method
synthetic data