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Direct electrical measurement of the electron g factor in ultra-thin InGaAs/InP single quantum wells.

Ed T. CrokeR. N. SchwartzB. ShiA. A. NarayananAndrey A. KiselevMark F. Gyure
Published in: Microelectron. J. (2005)
Keyphrases
  • computer vision
  • high speed
  • databases
  • factor analysis
  • electrical properties
  • neural network
  • data mining
  • social networks
  • case study
  • multiscale
  • quantum computing