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Contactless characterization of MEMS devices using optical microscopy.

András TimárGyörgy Bognár
Published in: DDECS (2009)
Keyphrases
  • mobile devices
  • image analysis
  • smart card
  • high throughput
  • charge coupled device
  • image enhancement
  • data sets
  • high resolution
  • rfid tags
  • embedded devices
  • font recognition
  • supply chain
  • x ray
  • solid state
  • optical fiber