Estimation of circuit output measurements including statistically dependent parameters.
Dimitris K. PapakostasAlkis A. HatzopoulosPublished in: Int. J. Circuit Theory Appl. (2003)
Keyphrases
- parameter estimation
- maximum likelihood estimation
- measured data
- input variables
- input data
- physical models
- high speed
- estimation process
- update equations
- measurement data
- parametric models
- parameter settings
- parameter values
- optical properties
- parameters estimation
- sensitivity analysis
- model selection
- parameter estimates
- measurement error
- frequency response
- noisy measurements
- closed form solutions
- maximum likelihood estimator
- estimation accuracy
- data sets
- maximum likelihood
- evolutionary algorithm