Transient dual interface measurement of junction-to-case thermal resistance in AlGaN/GaN HEMT utilizing an improved infrared microscope.
Yuwei ZhaiFaguo LiangChunsheng GuoYan LiuPublished in: Microelectron. Reliab. (2016)
Keyphrases
- infrared
- visible spectrum
- infrared images
- automatic target recognition
- thermal infrared
- infrared imagery
- multi sensor
- hyperspectral
- focal plane
- thermal images
- target detection and tracking
- electro optical
- infrared sensors
- thermal imaging
- night vision
- user interface
- infrared video
- gaze tracking
- time of flight
- image processing