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Post-breakdown characterization in thin gate oxides.

E. ViganòA. GhettiG. GhidiniAlessandro S. Spinelli
Published in: Microelectron. Reliab. (2002)
Keyphrases
  • field effect transistors
  • leakage current
  • steady state
  • database
  • data sets
  • data analysis
  • image processing
  • three dimensional
  • pattern recognition
  • low cost
  • low voltage