A CMOS IR-UWB Transceiver Design for Contact-Less Chip Testing Applications.
Yanjie WangAli M. NiknejadVincent C. GaudetKris IniewskiPublished in: IEEE Trans. Circuits Syst. II Express Briefs (2008)
Keyphrases
- circuit design
- ultra low power
- single chip
- high speed
- low cost
- chip design
- low power
- information retrieval
- phase locked loop
- design process
- physical design
- analog vlsi
- ultra wideband
- cmos technology
- cmos image sensor
- power consumption
- communication systems
- evolvable hardware
- multipath
- test cases
- computer simulation
- wireless sensor networks
- user interface