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A gray correlation based Bayesian network model for fault source diagnosis of multistage process - Small sample manufacturing system.
Kaiyang Chu
Rui Liu
Guijiang Duan
Published in:
Adv. Eng. Informatics (2023)
Keyphrases
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multistage
network model
manufacturing systems
small sample
fault diagnosis
neural network
dynamic programming
production system
fuzzy logic
machine learning
genetic algorithm
active learning
support vector machine
optimal policy
sample size
finite horizon