Progressive Hierarchical Deep Reinforcement Learning for defect wafer test.

Meng Xu Xinhong Chen Yechao She Jianping Wang

Published in: Knowl. Based Syst. (2024)

Keyphrases

reinforcement learning
state space
coarse to fine
defect detection
learning algorithm
information systems
dynamic programming
function approximation
search engine
multi agent
learning process
probabilistic model
hierarchical structure
reinforcement learning algorithms