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Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET.

Alain MichezJerome BochS. DhombresFrédéric SaignéAntoine D. TouboulJ.-R. VailléLaurent DusseauE. LorfèvreR. Ecoffet
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • mobile devices
  • power consumption
  • ionizing radiation
  • neural network
  • genetic algorithm
  • radiation therapy
  • embedded systems
  • electrical power