Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET.
Alain MichezJerome BochS. DhombresFrédéric SaignéAntoine D. TouboulJ.-R. VailléLaurent DusseauE. LorfèvreR. EcoffetPublished in: Microelectron. Reliab. (2013)