Diffraction in the high frequency regime by a thin layer of dielectric material I: The equivalent impedance boundary condition.
Olivier D. LafittePublished in: SIAM J. Appl. Math. (1998)
Keyphrases
- high frequency
- boundary conditions
- low frequency
- silicon dioxide
- x ray
- transmission line
- signal processing
- visual quality
- high resolution
- high frequencies
- wavelet transform
- wavelet coefficients
- subband
- shape from shading
- sufficient conditions
- boundary value problem
- poisson equation
- discrete wavelet transform
- frequency band
- wavelet domain
- low pass
- high frequency components
- multi resolution analysis
- image processing
- fixed point
- quotient space
- multiresolution