Magnet System for the Quantum Electromechanical Metrology Suite.
Rafael R. MarangoniDarine HaddadFrank SeifertLeon S. ChaoDavid B. NewellStephan SchlammingerPublished in: IEEE Trans. Instrum. Meas. (2020)
Keyphrases
- quantum computation
- camera calibration
- single view
- quantum computing
- process control
- quantum mechanics
- quantum inspired
- probability ranking principle
- similarity measure
- high speed
- multi view
- logic circuits
- quantum evolutionary algorithm
- knowledge base
- channel capacity
- artificial neural networks
- search algorithm
- feature extraction
- image sequences
- multimedia