36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate Through In-Cell Hot-Carrier Injection Burn-In.
Kunyang LiuZihan FuGen LiHongliang PuZhibo GuanXingyu WangXinpeng ChenHirofumi ShinoharaPublished in: ISSCC (2021)