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Combining Scan Test and Built-in Self Test.

Markus Seuring
Published in: J. Electron. Test. (2006)
Keyphrases
  • built in self test
  • integrated circuit
  • neural network
  • scan data
  • data sets
  • databases
  • real world
  • database systems
  • feature extraction
  • data structure
  • cooperative
  • artificial neural networks
  • user interface