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control in fast atomic force microscopy.

Ning ChuangIan R. PetersenHimanshu R. Pota
Published in: ACC (2011)
Keyphrases
  • atomic force microscopy
  • control system
  • process control
  • artificial intelligence
  • control method
  • control problems
  • databases
  • computer vision
  • image processing
  • web services
  • control strategy
  • robot control