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bilayer dielectrics for MIM capacitor applications.

Maurice KahnChristophe ValléeEmmanuel DefayCatherine DubourdieuMarceline BonvalotSerge BlonkowskiJean-Raoul PlaussuPierre GarrecThierry Baron
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • transmission line
  • short circuit
  • power supply
  • computer vision
  • image analysis
  • metal oxide
  • genetic algorithm
  • image processing
  • pattern recognition
  • search space
  • multi objective
  • state space
  • low cost