Positive-unlabeled convolutional neural networks for particle picking in cryo-electron micrographs.
Tristan BeplerAndrew MorinAlex J. NobleJulia BraschLawrence ShapiroBonnie BergerPublished in: CoRR (2018)
Keyphrases
- convolutional neural networks
- electron micrographs
- convolutional network
- cross sections
- positive and negative
- positive and unlabeled examples
- unlabeled data
- electron microscopy
- training data
- semi supervised learning
- labeled data
- active learning
- positive examples
- training set
- unsupervised learning
- mutual information
- object detection
- image analysis