Low-depth Uniform Threshold Circuits and the Bit-Complexity of Straight Line Programs.
Eric AllenderNikhil BalajiSamir DattaPublished in: Electron. Colloquium Comput. Complex. (2013)
Keyphrases
- straight line
- hough transform
- line detection
- line segments
- curvature estimation
- radon transform
- computational complexity
- random access memory
- line drawings
- shift register
- vanishing points
- depth information
- image processing
- depth map
- straight line segments
- high speed
- wavelet transform
- intersection points
- video sequences