QSPR analysis of HPLC column capacity factors for a set of high-energy materials using electronic van der waals surface property descriptors computed by transferable atom equivalent method.

Curt M. BrenemanMarlon Rhem
Published in: J. Comput. Chem. (1997)
Keyphrases
  • initial set
  • feature set
  • input data
  • van der waals
  • similarity measure
  • segmentation method
  • image matching
  • surface model